{
    "index":12,
    "title":"Application: Interpretable Device Failure",
    "paper":"Interpretable, Multidimensional, Multimodal Anomaly Detection with Negative Sampling for Detection of Device Failure",
    "by":   "Sipple et al",
    "when": "2020",
    "who":  "Bin Li",
    "mail": "bin.li@tu-dortmund.de",
    "note1":"real world data is messy",
    "note2":"detect IOT devices that fail",
    "ext":  "png"
}
